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10th IEEE Latin-American Test Workshop
(LATW 2009)

March 2-5, 2009
Buzios, Rio de Janeiro, Brazil

http://latw.tttc-events.org

CALL FOR PAPERS

Scope

The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind.

Topics of interest include but are not limited to:

  • Analog Mixed Signal Test
  • Automatic Test Generation
  • Board and System Test
  • Built-In Self-Test
  • Defect-Based Test
  • Design and Synthesis for Testability
  • Design Verification/Validation
  • Design for Manufacturability
  • Design of Reliable Embedded Software
  • D&T for Electromagnetic Compatibility
  • Economics of Test
  • Fault Analysis and Diagnosis
  • Fault Modeling and Simulation
  • Fault-Tolerance in HW/SW
  • Memory Test and Repair
  • On-Line Testing
  • Process Control and Measurements
  • Radiation Hardening Techniques
  • System-on-Chip Test
  • Yield Optimization

Topic Coordinators

  • Analog and Mixed-Signal - M. Renovell - LIRMM, France
  • DFT & BIST - A. Orailoglu, UC San Diego, USA
  • Electromagnetic Compatibility - E. Sicard, INSA Toulouse, France
  • On-line Test and Fault Tolerance - D. K. Pradhan, Univ. of Bristol, UK
  • Radiation Ground Testing - R. Ecoffet, CNES, France
  • Software Testing - S. Vergilio, UFPR, Brazil
  • Verification and High Level Test - M. P. Garcia, Univ. Carlos III, Spain

Submissions

Those interested in presenting recent results at the workshop are invited to submit papers using the IEEE format. PDF electronic submissions should be done via the workshop webpage: http://latw.tttc-events.org/.Accepted papers will optionally choose to be published in formal IEEE proceedings or in
a Digest of Papers. The Program Committee also welcomes proposals for embedded tutorials, panels
and special topic sessions. For additional information please contact one of the Program Co-Chairs.

Fabian Vargas vargas@computer.org
Raoul Velazco raoul.velazco@imag.fr

Key Dates

Submission deadline: November 15th , 2008
Notification of acceptance: December 9th, 2008
Final copy deadline: January 9th, 2009

Venue

LATW 2009 will be held in Buzios, Brazil. Originally settled by European pirates and slave traders, this happy mixture of many bloods prospered and became a picturesque fishing village. With more than 26 beaches that have a diversity of beauty never seen before, this small peninsula resembles a small island. It`s today a sophisticated beach resort with very active night life. Off season Búzios becomes a paradise for those who appreciate fine restaurants, arts and ecology. Búzios began its up scale resort with Brigitte Bardot in the 60’s. A statue of Bardot (the photo included in this CFP) is placed at Búzios harbour. Búzios lies 166 km (102 miles) from Rio de Janeiro. Rio de Janeiro, a city with a unique landscape. From Rio de Janeiro you can reach many other wonderful locations in Brazil.

Committees

Organizing Committee

General Chairs
M. Lubaszewski - UFRGS, Brazil
luba@ece.ufrgs.br

Y. Zorian – Virage Logic Corp., USA
yervant.zorian@viragelogic.com

Program Chairs
F. Vargas - PUCRS, Brazil
R. Velazco – TIMA, France

Local Chair
Erika Cota– UFRGS, Brazil

Finance Chair
F. Kastensmidt – UFRGS, Brazil

Panel Chairs
M. Abadir – Freescale, USA
E. Bezerra - PUCRS, Brazil

Embedded Tutorials Chairs
M. Reorda - Polito, Italy
Z. Peng– Linköping Univ., Sweden

Publicity Chairs
R.Reis - UFRGS, Brazil
L. Anghel - TIMA, France

Publication Chair
J. L. Guntzel, UFSC, Brazil

Industry Liaison
C. Duenãs, Freescale, Brazil

IEEE D&T Liaison
K. Roy – Purdue Univ., USA

TTEP Tutorials Liaison
V. Champac - INAOE, Mexico

West Europe Liaison
M. Flottes - LIRMM, France

East Europe Liaison
R. Ubar - Talin Tech. Univ., Estonia

North-America Liaison
N. Touba, Univ. Texas at Austin, USA

Program Committee
J. Abraham, Univ. Texas, USA
V. D. Agrawal, Auburn Univ., USA
F. Azaïs, LIRMM, France
V. Avendano, Freescale, Mexico
L. Balado, UPC, Spain
A. Brun, Univ. Paris-Sud, France
J. Calvano - Braz. Navy, Brazil
L.Carro - UFRGS, Brazil
A. Chatterjee, Georgia Tech., USA
E. Duarte Junior, UFPR, Brazil
A. Diaz-Mendez, INAOE, Mexico
A. O. Fernandes, UFMG, Brazil
J. Figueras, UPC, Spain
F. Fiori, POLITO, Italy
P. Fouillat, CNFM, France
D.Gizopoulos - Univ. Piraeus, Greece
J. P. Gyvez, NXP, The Netherlands
J. Hayes, Univ. Michigan, USA
J. Huertas - IMSE/CNM, Spain
C. F. Hawkins, UNM, USA
A. Ivanov, Univ. British Columbia, Canada
D. Lupi, INTI, Argentina
E. J. Marinissen, NXP, The Netherlands
Y. Mita, Univ. Tokyo, Japan
F. Moraes, PUCRS, Brazil
G. Peretti, UTN-FR Villa Maria, Argentina
J. Perez, UROU, Uruguay
J. Rayas-Sanchez, ITESO, Mexico
E. Romero, UTN-FR Villa Maria, Argentina
A. Rueda, IMSE-CNM, Spain
J. Segura, U. Illes Balears, Spain
C. Silva, PUCP, Peru
M. Soma, Univ. Washington, USA
J. Sosnowski, Warsaw Univ. Techn., Poland
J. M. de Souza, FITec, Brazil
M. Strum - USP, Brazil
J. Velasco-Medina, Univ. del Valle, Colombia
S. Vergilio, UFPR, Brazil
T. Weber, UFRGS, Brazil
A. Zenteno, Intel, Mexico
A. Zorzo, PUCRS, Brazil

Steering Committee
V. Champac (Chair)
M. S. Lubaszewski
J. Huertas
F. Vargas
R. Velazco
Y. Zorian

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Submission Deadline: 10th IEEE Latin-American Test Workshop (LATW), Rio de Janeiro, Brazil