CALL FOR PAPERS DSNOC’09

                       DATE Friday Workshop on
               Diagnostic Services in Network-on-Chips
          Test, Debug, and On-Line Monitoring (3rd Edition)

                     Nice, France, April 24, 2009

           Website: http://www.date-conference.com/node/553

INTRODUCTION

The Design, Automation and Test in Europe conference and exhibition is the
main European event bringing together designers and design automation
users, researchers and vendors, as well as specialists in hardware and
software design, test and manufacturing of electronic circuits and
systems. The conference includes plenary invited papers, regular papers,
panels, hot-topic sessions, tutorials and workshops, two special focus
days and a track for executives. Friday Workshops are focusing on emerging
research and application topics. At DATE 2009, one of the Friday Workshops
is devoted to Diagnostic Services in Network-on-Chips. This one-day event
consists of a plenary keynote, special session, regular and poster
presentations, and a panel session. It is the third edition of a sequence
of successful events hosted by DATE in 2007 and DAC in 2008.

WORKSHOP DESCRIPTION

Network-on-Chips (NoCs) are emerging as a new on-chip communication
paradigm. Diagnostic services, such as test, debug, and on-line
monitoring, are becoming an important factor in designing next-generation
NoC-based systems. The NoC infrastructure itself requires diagnostic
services, and can also be used to support those for the entire system.
Although significant research has been done in NoC design, there are many
open and pressing issues regarding diagnostic services. The focus of this
workshop is to explore them and their implications on system design. You
are invited to participate and submit your contributions to the workshop
on Diagnostic Services in Network-on- Chips. The area of interest is
described by, but not limited to, the following topics:

   * Manufacturing test of NoC and NoC-based systems
   * NoC fault and error modelling
   * On-line monitoring of NoC reliability and performance
   * Verification of NoC-based systems
   * NoC test benchmarking
   * Fault-tolerance approaches to NoC design
   * Reconfiguration for fault tolerance and diagnostics
   * Silicon debug and diagnosis of NoC infrastructure
   * Tools and methods to NoC diagnostic services
   * Debug for OS and application software

SUBMISSION

Submissions are invited in the form of extended abstracts not exceeding 2
pages and must be submitted for selection as PDF file to <axel@kth.se>.
All submissions will be evaluated with regard to their suitability for the
workshop, originality, and technical soundness. Submissions can be
accepted for regular or poster presentation. No formal proceedings will be
published, but an electronic Informal Digest of Contributions will be made
available to all workshop participants with all material that authors are
willing to provide: papers, abstract, slides, posters, etc.

Paper Submission deadline:         February 10, 2009
Notification of Acceptance:        March 1, 2009
Camera-Ready Material due date:    March 31, 2009

MORE INFORMATION

Nicola Nicolici - General Chair
McMaster University, Canada
Email: nicola@ece.mcmaster.ca

Axel Jantsch - Program Chair
Royal Institute of Technology, Sweden
Email: axel@kth.se

Thilo Pionteck - Special Session
University of Lübeck, Germany
Email: pionteck@iti.uni-luebeck.de

Erika Cota - Panel Chair
U Federal de Rio Grande Sul, Brazil
Email: erika@inf.ufrgs.br