16th IEEE International On-Line Testing Symposium
Dassia Chandris Hotel, Corfu, Greece, July 5–7, 2010
http://tima.imag.fr/conferences/iolts

Submission deadline: February 19, 2010 – Notification of acceptance: April 14, 2010 – Camera-ready papers due: May 14, 20

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens, and University of Piraeus.
The topics of interest include (but are not limited to) the following ones:

• Reliability issues in nanometer technologies
• On-line testing of analog and mixed signal circuits
• Radiation effects
• On-line testing in automotive, railway, avionics, industry
• Design for reliability
• On-line testing in the continuous operation of large systems
• Design for variability
• Field diagnosis, maintainability and reconfiguration
• On-line power monitoring and control
• Fault-tolerant and fail-safe systems
• On-line current, temperature, etc, monitoring
• Dependability evaluation
• Secure circuit design
• Dependable systems design
• Fault-based attacks and counter measures
• On-line and off-line built-in self-test
• Self-checking circuits and coding theory
• Synthesis of on-line testable circuits